Accelerated Lifetime Testing and Analysis of Delta-Doped Silicon Test Structures

Accelerated Lifetime Testing of OLED Luminaires

Crosslinked Remote-Doped Hole-Extracting Contacts Enhance Stability under Accelerated Lifetime Testing in Perovskite Solar Cells.

A crosslinked hole-extracting electrical contact is reported, which simultaneously improves the stability and lowers the hysteresis of perovskite solar cells. Polymerizable monomers and crosslinking processes are developed to obviate in situ degradation of the under lying perovskite. The crosslinked material is band-aligned with perovskite. The required free carrier density is induced by a high...

Spectroscopic ellipsometry of homoepitaxial diamond multilayers and delta-doped structures

Silicon microdisk structures with rare-earth doped amorphous silicon

The development of silicon-based active optical devices has been a target of constant interest in recent years due the possibility of integration with CMOS technology. Silicon doping with rareearth elements is an alternative for efficient light emission in the C-band. Particularly, erbium doped hydrogenated amorphous silicon (a-Si:H) is of interest given the high Er doping concentration tha...

Temperature dependent carrier lifetime studies on Ti-doped multicrystalline silicon

Carrier lifetime measurements were performed on deliberately Ti-doped multicrystalline silicon wafers using a temperature controlled photoconductance device. The dominant recombination center was found to be the double-donor level associated with interstitial titanium. The interstitial Ti concentrations in multicrystalline silicon wafers were determined by measuring the Shockley– Read–Hall time...